Missions

The I3EM team at CEMES-CNRS has been developing intensively in situ and operando experiments on functional materials. The group has already established the necessary instrumentation and methodology, from dedicated specimen preparation to electrical contacting, automation and modeling. Our preferred technique is off-axis electron holography, for which we provide training and all the software tools for the data analysis. We are looking for a highly motivated postdoctoral research scientist, skilled in transmission electron microscopy, to join the group. He or she will have the opportunity to learn our in-situ techniques and to carry out new experiments in the field. One of the important aspects will be the specimen preparation by focussed ion-beam (FIB).

Our recent work has shown that in-situ and operando experiments produce exciting and unexpected results [1-4]. We aim to continue these developments to understand the behaviour of a variety of nanoscale devices such as nanocapacitors, transistors, ferroelectric thin films and devices.

Part of the successful candidate's duties, once trained, will be to accompany external users with electron holography experiments within the METSA network and international collaborations. We also encourage the exploration of new in situ and interferometric techniques.

The initial contract of 24 months is extendable to 36 months (3 years). Starting date flexible.

[1] C. Gatel, R. Serra, K. Gruel, A. Masseboeuf, L. Chapuis, R. Cours, L. Zhang, B. Warot-Fonrose, and M. J. Hÿtch, Phys. Rev. Lett. 129, 137701 (2022). Extended charge layers in metal-oxide-semiconductor nanocapacitors revealed by operando electron holography. 10.1103/PhysRevLett.129.137701, hal-03787333
[2] M. Brodovoi, K. Gruel, A. Masseboeuf, L. Chapuis, M. Hÿtch, F. Lorut, and C. Gatel, Appl. Phys. Lett. 120, 233501 (2022). Mapping electric fields in real nanodevices by operando electron holography. 10.1063/5.0092019, hal-03752638
[3] L. Zhang, F. Lorut, K. Gruel, M.J. Hÿtch, and C. Gatel, Nano Letters 24, 5913-5919 (2024). Measuring electrical resistivity at the nanoscale in phase-change materials. 10.1021/acs.nanolett.4c01462
[4] L. Zhang, M. H. Raza, R. Wu, K. Gruel, C. Dubourdieu, M. Hÿtch, C. Gatel, Advanced Materials, 2413691 (2024). Quantification of interfacial charges in multilayered nanocapacitors by operando electron holography. 10.1002/adma.202413691

Activités

-The main activities will be:
• Focused ion beam (FIB) sample preparation
• Perform (in situ) electron holography experiments
• Study nanoscale physics of thin films and devices
• Accompanying external users in TEM experiments

Compétences

We are looking for a candidate highly motivated in developing in situ experiments on nanostructures. Candidates should be skilled in transmission electron microscopy (TEM) and have hands-on experience in specimen preparation by focussed ion-beam (FIB). Previous knowledge of electron holography is not necessary but candidates should be willing to learn. Knowledge of the physics of ferroic materials and/or microelectronics devices is a definite plus. The successful candidate should have good team spirit, dedicated work ethic and fluent in written and spoken English.

Contexte de travail

CEMES-CNRS is an internationally recognized laboratory in TEM studies as well as instrumental and methodological developments. The laboratory has many international collaborations and is founding member of the French national network for electron microscopy (METSA).

Electron holography will be carried out on our I2TEM microscope dedicated to in situ interferometry: a Hitachi HF-3300 (C) equipped with a cold-field emission gun, additional Lorentz stage placed above the objective lens for field-free imaging, an image corrector for wide fields of view (CEOS B-COR), several electron biprisms, direct electron detection camera (K3, Gatan) and imaging filter (GIF Quantum ER, Gatan). The microscope has automated drift control for in-situ experiments [5]. Chip-based holders for in-situ biasing and current injection complete the setup.

Extensive specimen preparation facilities include a dual-beam FIB-SEM (ThermoFisher Helios Nanolab 600i) equipped with Omniprobe micromanipulator and 5 gas injectors. The CEMES-CNRS laboratory also has 6 other microscopes, including an aberration-corrected TEM operating at 200 keV and capable of performing HRTEM and EDS/EELS analyses. The CEMES-CNRS laboratory also has a clean room for sputter deposition, atomic layer deposition (ALD) and AFM testing.

The laboratory also has privileged access to the nearby nanocharacterisation facility (Castaing centre) which houses a probe-corrected JEM-ARM200F (JEOL) equipped with EDS and EELS.

[5] C. Gatel, J. Dupuy, F. Houdellier, M.J. Hÿtch, Appl. Phys. Lett. 113, 133102 (2018). Unlimited acquisition time in electron holography by automated feedback control of transmission electron microscope. 10.1063/1.5050906, hal-01884057v1

Le poste se situe dans un secteur relevant de la protection du potentiel scientifique et technique (PPST), et nécessite donc, conformément à la réglementation, que votre arrivée soit autorisée par l'autorité compétente du MESR.