Researcher (M/F) : Development of fast and non-invasive methods to assess end-of-life electronic components

New

Laboratoire des technologies de la microélectronique

GRENOBLE • Isère

  • Researcher in FTC
  • 12 mounth
  • Doctorate

This offer is available in English version

This offer is open to people with a document recognizing their status as a disabled worker.

Offer at a glance

The Unit

Laboratoire des technologies de la microélectronique

Contract Type

Researcher in FTC

Working hHours

Full Time

Workplace

38054 GRENOBLE

Contract Duration

12 mounth

Date of Hire

01/05/2026

Remuneration

Between 3041€ and 3467€ gross

Apply Application Deadline : 19 March 2026 23:59

Job Description

Missions

This research topic aims to develop non-invasive, non-destructive, fast, and suitable techniques for qualifying integrated electronic circuits at the end of their first life cycle, in order to facilitate their reuse.

Activity

1. Study of the main aging mechanisms and their effects on the performance of an integrated circuit (IC).
2. Identification of aging and/or performance signatures that can be extracted using non-invasive and non-destructive methods, such as imaging techniques, thermal mapping, power consumption analysis, electromagnetic emission patterns, etc. These measurements will be conducted in combination with an accelerated aging protocol.
3. Analysis of the trade-off between high-fidelity characterization, testing time, cost, and the potential risk of damage to the tested integrated circuit.
4. AI techniques can be used to extract meaningful signatures and predict the results of high-fidelity characterization (which may require slow and/or destructive measurements during direct testing) from a set of faster, simpler, and non-destructive low-fidelity measurements.

Your Profil

Skills

Theoretical knowledge :
-Mastery of the principles of material and electronic component characterization (non-invasive methods, advanced imaging, thermal analysis, etc.).
-Knowledge of aging and degradation mechanisms in electronic systems (e.g., power amplifiers).
-Understanding of the challenges of circular electronics and qualification methods for component reuse.
Operational expertise::
-Experience in implementing accelerated aging tests and electrical measurements to assess component reliability.
-Ability to analyze and interpret experimental data (physical signatures, correlations with reliability).
-Use of artificial intelligence tools for data processing and identifying correlations between non-invasive signatures and electrical performance.
Interpersonal skills::
-Rigor and methodology in designing and applying complex experimental protocols.
-Creativity and innovation in developing qualification methods tailored to circular electronics.
-Collaborative mindset for working in multidisciplinary teams.

Your Work Environment

This work will be carried out at the Microelectronics Technology Laboratory (LTM), a joint research unit of the CNRS and the University of Grenoble Alpes (UGA) (UMR 5129) located on the CEA-LETI-MINATEC site in Grenoble. Around 100 people work at the LTM: 30 researchers or research professors, 18 engineers and technicians, 31 doctoral students, and 16 postdocs. The laboratory's activities are positioned at the frontier between upstream academic research and industrial research. Over the years, LTM has developed several direct partnerships with various players in the micro/nanoelectronics industry, notably STMicroelectronics in Crolles and Applied Materials in Santa Clara (USA).

This position is part of the Microelectronics LabEx at the University of Grenoble Alpes (UGA), a laboratory of excellence that brings together 12 laboratories (including one international) to address the technological, industrial, and environmental challenges of the next semiconductor revolution. Among other things, this project aims to develop innovative solutions in micro- and nanoelectronics, with a particular focus on sustainability and circular electronics.

The work will be associated with the chair of Prof. Jean-Pierre Raskin, internationally recognized for his research in advanced characterization of electronic components, system reliability, and non-invasive qualification methods. The candidate will contribute to the development of rapid, non-destructive characterization techniques for assessing the residual quality of electronic components and subsystems at the end of their life cycle, using cutting-edge technological platforms (nano-XRF imaging, aging test benches, X-ray microtomography, etc.).

Compensation and benefits

Compensation

Between 3041€ and 3467€ gross

Annual leave and RTT

44 jours

Remote Working practice and compensation

Pratique et indemnisation du TT

Transport

Prise en charge à 75% du coût et forfait mobilité durable jusqu’à 300€

About the offer

Offer reference UMR5129-MARCLO-108
CN Section(s) / Research Area Micro and nanotechnologies, micro and nanosystems, photonics, electronics, electromagnetism, electrical energy

About the CNRS

The CNRS is a major player in fundamental research on a global scale. The CNRS is the only French organization active in all scientific fields. Its unique position as a multi-specialist allows it to bring together different disciplines to address the most important challenges of the contemporary world, in connection with the actors of change.

CNRS

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Researcher (M/F) : Development of fast and non-invasive methods to assess end-of-life electronic components

Researcher in FTC • 12 mounth • Doctorate • GRENOBLE

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