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Portal > Offres > Offre UPR8011-MARHYT-005 - Chercheur contractuel (H/F) en microscopie électronique in-situ et operando de composants électroniques

Postdoctoral position (M/F). In-situ and operando electron microscopy of microelectronic devices

This offer is available in the following languages:
Français - Anglais

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General information

Reference : UPR8011-MARHYT-005
Workplace : TOULOUSE
Date of publication : Friday, July 10, 2020
Type of Contract : FTC Scientist
Contract Period : 12 months
Expected date of employment : 1 October 2020
Proportion of work : Full time
Remuneration : 2617€ to 3729€ gross/month as a function of experience
Desired level of education : PhD
Experience required : 1 to 4 years


We are looking for a resourceful postdoctoral research scientist to join the team at CEMES-CNRS working on the development of in-situ and operando electron holography experiments (I3EM group). Our aim is to operate microelectronic components within the electron microscope whilst measuring the resulting electric, magnetic and strain fields at the nanoscale. As initial experiments show, in-situ and operando experiments produce exciting and sometimes surprising results. We aim to continue this work and develop a detailed understanding of the physics of nanoscale devices. A variety of nanocapacitors, ferroelectric thin films and phase-change memory (PCM) devices will be studied.

The key to these experiments is specimen preparation. Test devices and thin-film capacitors are extracted by focussed ion-beam (FIB) and contacted to specially designed lift-out grids with patterned electrodes for dedicated biasing holders. It is essential to produce thin specimen areas of uniform thickness and minimal surface damage layers whilst maintaining the electrical contacts. In addition, samples must be well characterised, both chemically and structurally, before carrying out the in-situ experiments. Detailed analysis of the results will be required to develop understanding of the physical processes in play during device operation. This is particularly true for piezoelectric material where we hope to observe the interplay of electric and strain fields at the nanoscale in a fully quantitative way for the first time.
The initial contract of 12 months is extendable to 36 months (3 years). Starting date flexible.


The main activities will be

• specimen preparation and contacting
• initial TEM characterisation
• participation to operando experiments
• analysis of the experimental results
• understanding of the physical processes


We are particularly looking for a candidate experienced in advanced specimen preparation by FIB where extreme care and low-energy milling is required. Examples could be sample preparation for electron holography, quantitative HRTEM or tomographic atom probe (TAP). Experience in advanced transmission electron microscopy techniques is of course welcome and knowledge of the physics of ferroelectrics and/or microelectronics devices is a definite plus.

The successful candidate should have good team spirit, dedicated work ethic and fluent in written and spoken English.

Work Context

CEMES-CNRS is part of the ESTEEM3 European infrastructure for electron microscopy and leads the workpackage on in-situ microscopy. Devices will be studied in collaboration with a major semiconductor company. Work on thin-film ferroelectric oxides will be in collaboration with the MEM group within a Franco-German project.

Specimen preparation will be carried out on a dual-beam FIB-SEM (ThermoFisher Helios Nanolab 600i) equipped with Omniprobe micromanipulator and 5 gas injectors.
Electron holography will be carried out our I2TEM microscope dedicated to in-situ interferometry: a Hitachi HF-3300 (C) equipped with a cold field emission gun, additional Lorentz stage placed above the objective lens for field-free imaging, an image corrector for wide fields of view (CEOS B-COR), four electron biprisms, rapid 4k × 4k CCD camera (OneView, Gatan) and imaging filter (GIF Quantum ER, Gatan). Chip-based biasing holders from Gatan and Hummingbird complete the setup. For a description of the TEM facility, see

Additional structural characterisation is available on a probe-corrected TEM/STEM (ARM200F CFEG, JEOL) equipped with high-efficiency EDS and imaging filter (GIF Quantum ER, Gatan) at the Toulouse characterisation platform (UMS Castaing).

Additional Information

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